probe card

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• Probe card — A probe card is an interface between an electronic test system and a semiconductor wafer. Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the… …   Wikipedia

• Probe — may refer to:Media and entertainment* Probe (1972 TV pilot), a pilot for the sci fi series Search * Probe (TV series), a 1988 series * Probe (Philippine TV series) * Probe Records, a record label * Probe Entertainment, a British videogame… …   Wikipedia

• Probe (parlor game) — The parlor game Probe was introduced in the 1960s by Parker Brothers.DescriptionThe game set originally consisted of four plastic display racks each able to hold twelve cards, with a point value assigned to each card position: 5 10 15 15 10 5 5… …   Wikipedia

• Octopus card — 八達通 Location Hong Kong Launched …   Wikipedia

• British national identity card — Enabling legislation for the British national identity card was passed under the Identity Cards Act 2006. [ [http://www.opsi.gov.uk/ACTS/acts2006/20060015.htm Identity Cards Act 2006] , Office of Public Sector Information, accessed 14 October… …   Wikipedia

• Network Monitoring Interface Card — A network monitoring interface card or NMIC is similar to a network card (NIC). However, unlike a standard network card, an NMIC is designed to passively (and silently) listen on a network. At a functional level, an NMIC may differ from a NIC, in …   Wikipedia

• Non-contact wafer testing — Wafer testing is a normal step in semiconductor device fabrication, used to detect defects in integrated circuits (IC) before they are assembled during the IC packaging step. Traditional (contact) wafer testing Probing ICs while they are still on …   Wikipedia

• Parallel computing — Programming paradigms Agent oriented Automata based Component based Flow based Pipelined Concatenative Concurrent computing …   Wikipedia

• Wafer prober — A wafer prober is a machine used to test integrated circuits. OverviewIntegrated circuits are fabricated in large numbers by a complex series of printing steps on silicon wafers. This process permits integrated circuits to be produced cheaply but …   Wikipedia

• Electrical Wafer Sorting — Pour les articles homonymes, voir EWS. L Electrical Wafer Sorting (E.W.S.) est un procédé permettant de trier les puces fonctionnelles sur les plaques de silicium dès leur sortie de l usine, avant leur mise en boîtier. Fonction EWS :… …   Wikipédia en Français

• CIA leak scandal timeline — Note: This subject is also referred to as: CIA leak case timeline , Plamegate scandal timeline , and Plame affair timeline . The CIA leak scandal timeline (also known as the CIA leak case timeline, the Plamegate scandal timeline, and the Plame… …   Wikipedia